Item Name | Semiconductor Device Diode |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5961 Semiconductor Devices and Associated Hardware |
National Item Identification Number (NIIN) | 00-912-4907 (009124907) |
NCB Code | USA (00) |
Manufacturer | General Instrument Corporation, Honeywell International Inc, Wavetek Rf Products Inc, General Semiconductor Inc, Military Specifications, Kay Elemetrics Corporation, Gte Government Systems Corp, Picatinny Arsenal, General Dynamics Mission Systems, Telonic Berkeley Inc, Electronic Industries Inc, Astronics Test Systems Inc, Wavetek U S Inc, Sylvania Electric Products Inc, General Dynamics Advanced, Rockwell Collins Aerospace, Lockheed Martin Corporation, Inspektorat Wsparcia Sil Zbrojnych, Leonardo Mw Ltd, Aeronautical Communications |
Part Number | Manufacturer | Item Name | Cage Code | RFQ |
---|---|---|---|---|
1N82AG | general instrument corporation | semiconductor device diode | 11711 | RFQ |
007-6017-00 | honeywell international inc | semiconductor device diode | 22373 | RFQ |
4807-03-0003 | wavetek rf products inc | semiconductor device diode | 34280 | RFQ |
1N82AG | general semiconductor inc | semiconductor device diode | 14936 | RFQ |
MIL-S-19500/250 | military specifications | semiconductor device diode | 81349 | RFQ |
6357-91 | kay elemetrics corporation | semiconductor device diode | 80138 | RFQ |
D3530 | gte government systems corp | semiconductor device diode | 11293 | RFQ |
1N82A | general semiconductor inc | semiconductor device diode | 14936 | RFQ |
1N82 | general semiconductor inc | semiconductor device diode | 14936 | RFQ |
8852486 | picatinny arsenal | semiconductor device diode | 19203 | RFQ |
6642 | general dynamics mission systems | semiconductor device diode | 04655 | RFQ |
1N82AS | telonic berkeley inc | semiconductor device diode | 04423 | RFQ |
6357-51 | kay elemetrics corporation | semiconductor device diode | 80138 | RFQ |
1N147A | electronic industries inc | semiconductor device diode | 80131 | RFQ |
210026 | astronics test systems inc | semiconductor device diode | 21793 | RFQ |
DG100-821 | wavetek u s inc | semiconductor device diode | 23338 | RFQ |
1N82A | sylvania electric products inc | semiconductor device diode | 93332 | RFQ |
6357-38 | kay elemetrics corporation | semiconductor device diode | 80138 | RFQ |
1N82AG | general dynamics advanced | semiconductor device diode | 07397 | RFQ |
353-9012-010 | rockwell collins aerospace | semiconductor device diode | 13499 | RFQ |
4JD2D4 | lockheed martin corporation | semiconductor device diode | 03538 | RFQ |
353-2542-001 | rockwell collins aerospace | semiconductor device diode | 95105 | RFQ |
5961PL0189933 | inspektorat wsparcia sil zbrojnych | semiconductor device diode | 9009h | RFQ |
A41-0015-01 | telonic berkeley inc | semiconductor device diode | 04423 | RFQ |
007K6017-00 | leonardo mw ltd | semiconductor device diode | k0668 | RFQ |
RELEASE2910 | electronic industries inc | semiconductor device diode | 80131 | RFQ |
A7454 | aeronautical communications | semiconductor device diode | 81535 | RFQ |
JAN1N82AG | military specifications | semiconductor device diode | 81349 | RFQ |
6642 | gte government systems corp | semiconductor device diode | 11293 | RFQ |
D3530 | general dynamics mission systems | semiconductor device diode | 04655 | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ABHP | OVERALL LENGTH | 0.230 INCHES MINIMUM AND 0.300 INCHES MAXIMUM |
ABJT | TERMINAL LENGTH | 1.000 INCHES MINIMUM AND 1.500 INCHES MAXIMUM |
ADAV | OVERALL DIAMETER | 0.085 INCHES MINIMUM AND 0.107 INCHES MAXIMUM |
AXGY | MOUNTING METHOD | TERMINAL |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 3.0 MAXIMUM REVERSE VOLTAGE,INSTANTANEOUS |
CTQX | CURRENT RATING PER CHARACTERISTIC | 25.00 MILLIAMPERES MAXIMUM AVERAGE ON-STATE CURRENT,180 DEGREES CONDUCTION ANGLE,AVERAGE OVER A FULL 60-HZ CYCLE |
CTRD | POWER RATING PER CHARACTERISTIC | 100.0 MILLIWATTS MAXIMUM POWER OUTPUT |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 100.0 DEG CELSIUS AMBIENT AIR |
MATT | MATERIAL | GLASS INCLOSURE |
MATT | MATERIAL | SILICON SEMICONDUCTOR |
TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI |
TTQY | TERMINAL TYPE AND QUANTITY | 2 UNINSULATED WIRE LEAD |
ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/250 GOVERNMENT SPECIFICATION |
Relevant Components for NSN - 5961-00-912-4907, 5961009124907 | ||||
5930-01-201-0344 (5930012010344) | 5935-00-733-6624 (5935007336624) | 5935-01-670-0032 (5935016700032) | 5935-01-238-8280 (5935012388280) | |
5945-00-772-0597 (5945007720597) | 5998-01-470-7299 (5998014707299) | 5998-01-450-1035 (5998014501035) | 5995-01-305-0350 (5995013050350) | |
5935-01-438-9012 (5935014389012) | 5998-01-080-8351 (5998010808351) | 5998-01-518-1172 (5998015181172) | 5935-01-141-2602 (5935011412602) | |
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